| 姚雅萱,任玲玲,高思田,赵迎春,高慧芳,陶兴付.化学通报,2015,78(2):100-106. |
| 石墨烯层数测量方法的研究进展 |
| Review of graphene layer number measurement methods |
| 投稿时间：2014-05-13 修订日期：2014-06-24 |
| DOI： |
| 中文关键词: 石墨烯,层数,测量方法 |
| 英文关键词:graphene, layer number, characterization |
| 基金项目:国家科技支撑计划项目(2011BAK15B04)资助 |
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| 摘要点击次数: 3693 |
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| 中文摘要: |
| 石墨烯具有高导电性、高韧度、高强度、超大比表面积等特点,在电子、航天军工、新能源、新材料等领域有广泛应用。对石墨烯层数测量方法的研究有助于深入理解石墨烯性能与微观结构之间的关系。本文中着重阐述了包括光学显微镜、拉曼光谱(Raman)、原子力显微镜(AFM)和透射电镜(TEM)等测量石墨烯层数的方法,同时比较了各种测量方法的优点及局限性,并指出石墨烯层数的测量方法还有待进一步的完善。 |
| 英文摘要: |
| Due to its high conductivity, high toughness, high strength and large specific surface area, graphene has been widely used in areas such as electronic area, aerospace industry, new energy, advanced materials and etc. Study of graphene layer number measurement methods helps us to further understand the relationship between the performance and microstructure of graphene. In this paper, several graphene layer number measurement methods are discussed including optical microscopy, Raman spectroscopy, atomic force microscopy (AFM), transmission electron microscopy (TEM) and etc. The benefits and limitations for each method are also discussed in this paper. After comparison of these typically used characterization methods for graphene layer number measurement, it is also mentioned that the characterization measurement methods of graphene layer numbers remains to be further improved. |
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