| 金珍,张慧,马泓冰,张海明,迟力峰.化学通报,2023,86(7):769-774. |
| 非接触式原子力显微镜在分子几何结构解析中的应用进展 |
| The application progress of non-contact atomic force microscopy in molecular geometric structure analysis |
| 投稿时间：2023-01-02 修订日期：2023-01-20 |
| DOI： |
| 中文关键词: 非接触式原子力显微术 qPlus传感器 化学键分辨图 表面在位反应 |
| 英文关键词:non-contact atomic force microscopy, qPlus sensor, chemical-bond-resolved image, on-surface reaction |
| 基金项目:国家自然科学基金项目(22072103)资助 |
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| 中文摘要: |
| 具有化学键分辨的非接触式原子力显微（nc-AFM）表征展现出了优异的分子结构解析能力，是近十年来显微表征领域里的代表性进展，成为表面分子相关研究的重要工具。本文首先介绍了化学键分辨的非接触式原子力显微镜的核心部件: qPlus传感器，以及实现化学键分辨所必须的针尖修饰技术。围绕该表征方法在分子几何结构成像上的功能，重点介绍了nc-AFM在天然产物结构确定以及表面在位反应研究上的最新进展。 |
| 英文摘要: |
| Non-contact atomic force microscopy (nc-AFM) with chemical-bond-resolved functionality represents the most remarkable advance in microscopic characterization, becoming a powerful tool in the characterization of molecule-related phenomena on surfaces. In this review, we first briefly introduce the core component of nc-AFM: the qPlus sensor, and the necessary technique to achieve chemical bond resolved characterization: tip functionalization. Focusing on the main function of nc-AFM in chemical-bond-resolved imaging, recent advances in this field are reviewed with an emphasis on the structural determination of natural products and related applications in the area of on-surface synthesis. |
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